الرئيسية › دليل الباحثين › Mohammed Ledra

Mohammed Ledra

الانتماء : University of Biskra · University of Constantine 3

• 14منشورات (انتماء جزائري)
• 40مجموع المنشورات
• 54الاستشهادات
• 5مؤشر h

ORCIDOpenAlex

مجالات البحث

• Semiconductor materials and interfaces
• Experimental and Theoretical Physics Studies
• Electron and X-Ray Spectroscopy Techniques
• Silicon and Solar Cell Technologies
• Engineering and Technology Innovations

المنشورات (14)

• On electron and hole accumulation in a core-shell nanowire: Study by a Monte Carlo simulation
  2024 · Micro and Nanostructures
• Effects of a linear arrangement of embedded Ge nanocrystals on an electron beam induced current
  2022 · Micro and Nanostructures · استُشهد به 2 مرة
• Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique
  2021 · Semiconductors · استُشهد به 1 مرة
• Simulated Contrast of Two Dislocations
  2019 · Semiconductors · استُشهد به 2 مرة
• Simulated contrast of two dislocations -=SUP=-*-=/SUP=-
  2019 · Журнал технической физики
• Monte-Carlo simulation of nano-collected current from a silicon sample containing a linear arrangement of uncapped nanocrystals
  2015 · Journal of Applied Physics · استُشهد به 6 مرة
• Extraction of the defect density of states in microcrystalline silicon from experimental results and simulation studies
  2015 · Journal of Semiconductors · استُشهد به 1 مرة
• Caractérisation électrique et optique des diodes électroluminescentes
  2015 · DOAJ (DOAJ: Directory of Open Access Journals)
• Effect of the surface recombination and the depletion region on the electron beam induced current at a Schottky nanocontact
  2013 · International Journal of Nanoparticles · استُشهد به 3 مرة
• Electron beam induced current at a Schottky nanocontact
  2009 · International Journal of Nano and Biomaterials · استُشهد به 5 مرة
• Monte Carlo simulation of the EBIC collection efficiency of a Schottky nanocontact
  2008 · Superlattices and Microstructures · استُشهد به 14 مرة
• NOUVEL ALGORITHME DE SIMULATION MONTÉ CARLO DU COURANT EBIC DANS LES SEMICONDUCTEURS
  2006 · Courrier du Savoir (Universite de Biskra)
• Monte Carlo simulation of the contrast of SEM charge-collection images of dislocations in semiconductors
  2005 · Journal of Physics D Applied Physics · استُشهد به 10 مرة
• Monte carlo simulation of the EBIC grain boundary contrast in semiconductors
  1996 · Materials Science and Engineering B · استُشهد به 10 مرة

مجلات النشر

• Micro and Nanostructures × 2
• Semiconductors × 2
• Журнал технической физики × 1
• Journal of Applied Physics × 1
• Journal of Semiconductors × 1
• DOAJ (DOAJ: Directory of Open Access Journals) × 1

المنشورات حسب السنة

• 20241
• 20221
• 20211
• 20192
• 20153
• 20131
• 20091
• 20081
• 20061
• 20051

المؤلفون المشاركون

• N. Ouhabab
• Toufik Tibermacine
• Z. Ogbi
• Noura Ounissi
• H. Tabbi

البيانات البيبليوغرافية مصدرها OpenAlex (قاعدة مفتوحة).