Home › Researcher directory › W. Terghini
W. Terghini
Affiliation : University of Biskra
- 3Publications (affiliation in Algeria)
- 3Total publications
- 1Citations
- 1h-index
Research profile
W. Terghini has 3 indexed publications (2012–2016). Their work appears mainly in “Courrier du Savoir (Universite de Biskra)” and “Journal of New Technology and Materials”. Their most cited article, “MEASUREMENT AND ANALYSIS OF I-V-T CHARACTERISTICS OF A AUGENI/P-SI SCHOTTKY BARRIER DIODE” (2015), has been cited 1 times. 2 of these publications date from the last three years of activity. Their work is co-authored with at least 5 researchers.
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Create my free profile Add my publicationsResearch areas
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and interfaces
- GaN-based semiconductor devices and materials
- Silicon and Solar Cell Technologies
- Particle Detector Development and Performance
Publications (3)
- ELECTRICAL CHARACTERIZATION OF THE FORWARD CURRENT- VOLTAGE OF AL IMPLANTED 4H-SIC PIN DIODES
- MEASUREMENT AND ANALYSIS OF I-V-T CHARACTERISTICS OF A AUGENI/P-SI SCHOTTKY BARRIER DIODE
- Extraction of important parameters of a silicon diode used as particles detector
Publication venues
- Courrier du Savoir (Universite de Biskra) × 1
- Journal of New Technology and Materials × 1
Publications per year
- 20161
- 20151
- 20121
Collaborations
Partner institutions : University of Batna 1
Co-authors
Bibliographic data from OpenAlex (open database).
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