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O. Meyer
Affiliation : Centre National de la Recherche Scientifique · Université Paris-Saclay · Laboratoire de Génie Électrique et Électronique de Paris · Sorbonne Université · CentraleSupélec
- 9Publications (affiliation in France)
- 87Total publications
- 351Citations
- 11h-index
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Create my free profile Add my publicationsResearch areas
- Microwave and Dielectric Measurement Techniques
- Microwave Imaging and Scattering Analysis
- Microwave-Assisted Synthesis and Applications
- Neural Networks and Applications
- Electromagnetic Fields and Biological Effects
Publications (9)
- Multiple non-linear regression for microwaves characterization of dielectric materials
- Predictors Generation by Partial Least Square Regression for microwave characterization of dielectric materials
- An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials
- Microwave Characterization using Predictors Generation Partial Least Square Regression
- Microwave characterization using partial least square regression
- Microwave Characterization Using Least-Square Support Vector Machines
- Support vector machines for measuring dielectric properties of materials
- Microwave characterization using ridge polynomial neural networks and least-square support vector machines
- Microwave Characterization Using Ridge Polynomial Neural Networks and Least-Square Support Vector Machines
Co-authors
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