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M. Eddrief

Affiliation : Centre National de la Recherche Scientifique · Institut des NanoSciences de Paris

• 3Publications (affiliation in France)
• 219Total publications
• 4131Citations
• 36h-index

ORCIDOpenAlex

Research profile

M. Eddrief has 3 indexed publications (1999–2017). Their work appears mainly in “Journal of Applied Physics”, “Applied Surface Science” and “Surface Review and Letters”. Their most cited article, “Influence of ion implantation parameters on the perpendicular magnetic anisotropy of Fe-N thin films with stripe domains” (2017), has been cited 16 times. Their work is co-authored with at least 12 researchers, including institutions in Algeria.

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Research areas

• Magnetic properties of thin films
• Semiconductor materials and interfaces
• 2D Materials and Applications
• Surface and Thin Film Phenomena
• Magnetic Properties and Applications

Publications (3)

• Influence of ion implantation parameters on the perpendicular magnetic anisotropy of Fe-N thin films with stripe domains
  2017 · Journal of Applied Physics · cited 16 times
• Study of Fe deposition upon a layered compound: GaSe
  2000 · Applied Surface Science · cited 5 times
• EFFECT OF Cu DEPOSITION AND ANNEALING UPON A GaSe/Si(111) HETEROJUNCTION
  1999 · Surface Review and Letters · cited 7 times

Publication venues

• Journal of Applied Physics × 1
• Applied Surface Science × 1
• Surface Review and Letters × 1

Publications per year

• 20171
• 20001
• 19991

Collaborations

Partner institutions : Université Pierre-et-Marie-Curie · Institut de minéralogie, de physique des matériaux et de cosmochimie · Université Oran 1 Ahmed Ben Bella · Université de Versailles Saint-Quentin-en-Yvelines · Laboratoire d'Ingénierie des Systèmes de Versailles

Co-authors’ countries : Algeria

Co-authors

• C.A. Sébenne
• M. Zerrouki
• B. Abidri
• J.-P. Lacharme
• M. Ghamnia
• Louis-Charles Garnier
• J. L. Cantin
• M. Marangolo
• Hans Jürgen von Bardeleben
• Victor Hugo Etgens
• Teyri Amarouche
• Franck Fortuna

Bibliographic data from OpenAlex (open database).