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B. Cretu
Affiliation : Centre National de la Recherche Scientifique · École Nationale Supérieure d'Ingénieurs de Caen · Normandie Université · GREYC · Université de Caen Normandie
- 18Publications (affiliation in France)
- 120Total publications
- 883Citations
- 16h-index
Research profile
B. Cretu has 18 indexed publications (2011–2018). Their work appears mainly in “Solid-State Electronics”, “HAL” and “International Conference on Noise and Fluctuations”. Their most cited article, “Low frequency noise characterization in n-channel FinFETs” (2011), has been cited 35 times. 5 of these publications date from the last three years of activity. Their work is co-authored with at least 9 researchers, including institutions in Algeria, Tunisia.
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Create my free profile Add my publicationsResearch areas
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Semiconductor materials and interfaces
- Integrated Circuits and Semiconductor Failure Analysis
Publications (18)
- Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors – Physical interpretation of transport phenomena
- Impact of channel orientation on low frequency noise performances of UTBOX nMOSFETs operated at liquid nitrogen temperature
- Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs
- Static and low frequency noise characterization of n-channel 16 nm UTBOX devices
- Static and low frequency noise characterization of n-channel 16 nm UTBOX devices
- Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
- In depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
- Performances under saturation operation of p-channel FinFETs on SOI substrates at cryogenic temperature
- Low temperature noise spectroscopy of p-channel SOI FinFETs
- DC and low frequency noise performances of SOI p-FinFETs at very low temperature
- Detailled characterisation of SOI n-FinFETs at very low temperature
- DC and noise performances of SOI FinFETs at very low temperature
- Low frequency noise characterization in n-channel FinFETs
- Low frequency noise characterization in n-channel FinFETs
- Uncertainties in the estimation of low frequency noise level extracted from noise spectral density measurements
- Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
- Low Frequency Noise Spectroscopy in Advanced nFinFETS
- Assessment of temperature dependence of the low frequency noise in unstrained and strained FinF
Publication venues
- Solid-State Electronics × 5
- HAL × 5
- International Conference on Noise and Fluctuations × 3
- Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon × 2
- International Conference on Information and Digital Technologies (IDT) × 1
- International Conference on Sciences of Electronics, Technologies of Information and Telecommunications × 1
Publications per year
- 20181
- 20173
- 20161
- 20151
- 20143
- 20132
- 20122
- 20115
Collaborations
Partner institutions : Mouloud Mammeri University of Tizi-Ouzou · University of Carthage · National Institute of Applied Science and Technology
Co-authors’ countries : Algeria · Tunisia
Co-authors
- R. Carin
- Jean‐Marc Routoure
- Hakim Achour
- Rachida Talmat
- B. Nafaa
- Sheng Wu
- Bruno Guillet
- Abdelkarim Mercha
- Eric Sassier
Bibliographic data from OpenAlex (open database).
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