الرئيسية › دليل الباحثين › Hafida Sehil

Hafida Sehil

الانتماء : Université Djilali de Sidi Bel Abbès

• 13منشورات (انتماء جزائري)
• 19مجموع المنشورات
• 92الاستشهادات
• 5مؤشر h

OpenAlex

مجالات البحث

• Advancements in Semiconductor Devices and Circuit Design
• Thin-Film Transistor Technologies
• Organic Electronics and Photovoltaics
• Semiconductor materials and devices
• Semiconductor materials and interfaces

المنشورات (13)

• Lead removal kinetics from synthetic effluents using Algerian pine, beech and fir sawdust’s: optimization and adsorption mechanism
  2014 · Applied Water Science · استُشهد به 34 مرة
• 3-aminopyridine release study from polymeric supports in homogeneous and heterogeneous media
  2011 · Mediterranean Journal of Chemistry · استُشهد به 1 مرة
• Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors
  2001 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · استُشهد به 1 مرة
• Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells
  2001 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · استُشهد به 1 مرة
• Study of lateral polysilicon PN diodes C–V characteristics: Modeling and experiments
  1998 · Solid-State Electronics · استُشهد به 5 مرة
• Simulation of the high frequency C–V characteristics of lateral PN junctions on polysilicon films
  1997 · Materials Science and Engineering B · استُشهد به 9 مرة
• Characterization of the polysilicon thin film transistors elaborated in high and low temperature processes. Study of the density of traps
  1997 · Synthetic Metals · استُشهد به 3 مرة
• A MOS structure temperature characterization
  1997 · Materials Science and Engineering B · استُشهد به 2 مرة
• Effects of the in-situ drain doping on hot-carrier degradation in polysilicon thin film transistors
  1996 · Solid-State Electronics · استُشهد به 6 مرة
• Conduction behaviour of low-temperature (≤600°C) polysilicon TFTs with an in situ drain doping level
  1995 · Solid-State Electronics · استُشهد به 12 مرة
• The analysis of the leakage current of polycrystalline silicon thin-film transistors as a function of active layer thickness
  1995 · Materials Chemistry and Physics · استُشهد به 3 مرة
• Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
  1994 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · استُشهد به 3 مرة
• Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method
  1994 · Materials science forum · استُشهد به 2 مرة

مجلات النشر

• Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena × 3
• Solid-State Electronics × 3
• Materials Science and Engineering B × 2
• Applied Water Science × 1
• Mediterranean Journal of Chemistry × 1
• Synthetic Metals × 1

المنشورات حسب السنة

• 20141
• 20111
• 20012
• 19981
• 19973
• 19961
• 19952
• 19942

المؤلفون المشاركون

• Z. Benamara
• R. Menezla
• Baya Zebentout
• Negin Rahmani
• Zineb Elbahri
• Zohra Bengharez
• Boudali Akkal
• A. Boudissa
• Houaria Merine
• Y. Bourezig
• H. Dib
• Kaddour Guemra

البيانات البيبليوغرافية مصدرها OpenAlex (قاعدة مفتوحة).