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Hafida Sehil

Affiliation : Université Djilali de Sidi Bel Abbès

13Publications (affiliation in Algeria)
19Total publications
92Citations
5h-index

Research profile

Hafida Sehil has 13 indexed publications (1994–2014). Their work appears mainly in “Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena”, “Solid-State Electronics” and “Materials Science and Engineering B”. Their most cited article, “Lead removal kinetics from synthetic effluents using Algerian pine, beech and fir sawdust’s: optimization and adsorption mechanism” (2014), has been cited 34 times. Their work is co-authored with at least 12 researchers.

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Research areas

Advancements in Semiconductor Devices and Circuit Design
Thin-Film Transistor Technologies
Organic Electronics and Photovoltaics
Semiconductor materials and devices
Semiconductor materials and interfaces

Publications (13)

Lead removal kinetics from synthetic effluents using Algerian pine, beech and fir sawdust’s: optimization and adsorption mechanism
2014 · Applied Water Science · cited 34 times
3-aminopyridine release study from polymeric supports in homogeneous and heterogeneous media
2011 · Mediterranean Journal of Chemistry · cited 1 times
Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors
2001 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · cited 1 times
Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells
2001 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · cited 1 times
Study of lateral polysilicon PN diodes C–V characteristics: Modeling and experiments
1998 · Solid-State Electronics · cited 5 times
Simulation of the high frequency C–V characteristics of lateral PN junctions on polysilicon films
1997 · Materials Science and Engineering B · cited 9 times
Characterization of the polysilicon thin film transistors elaborated in high and low temperature processes. Study of the density of traps
1997 · Synthetic Metals · cited 3 times
A MOS structure temperature characterization
1997 · Materials Science and Engineering B · cited 2 times
Effects of the in-situ drain doping on hot-carrier degradation in polysilicon thin film transistors
1996 · Solid-State Electronics · cited 6 times
Conduction behaviour of low-temperature (≤600°C) polysilicon TFTs with an in situ drain doping level
1995 · Solid-State Electronics · cited 12 times
The analysis of the leakage current of polycrystalline silicon thin-film transistors as a function of active layer thickness
1995 · Materials Chemistry and Physics · cited 3 times
Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
1994 · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · cited 3 times
Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method
1994 · Materials science forum · cited 2 times

Publication venues

Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena × 3
Solid-State Electronics × 3
Materials Science and Engineering B × 2
Applied Water Science × 1
Mediterranean Journal of Chemistry × 1
Synthetic Metals × 1

Publications per year

20141
20111
20012
19981
19973
19961
19952
19942

Co-authors

Bibliographic data from OpenAlex (open database).