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M. Berrabah

Affiliation : University Frères Mentouri Constantine 1

4Publications (affiliation in Algeria)
6Total publications
20Citations
2h-index

Research profile

M. Berrabah has 4 indexed publications (2001–2008). Their work appears mainly in “Applied Surface Science”, “Semiconductor Science and Technology” and “Revue Sciences Humaines (Université des Frères Mentouri Constantine 1)”. Their most cited article, “Deconvolution of SIMS depth profiles: Towards simple and faster techniques” (2008), has been cited 12 times. 2 of these publications date from the last three years of activity. Their work is co-authored with at least 7 researchers.

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Research areas

Semiconductor materials and devices
Semiconductor materials and interfaces
Electron and X-Ray Spectroscopy Techniques
Ion-surface interactions and analysis
Numerical methods in inverse problems

Publications (4)

Deconvolution of SIMS depth profiles: Towards simple and faster techniques
2008 · Applied Surface Science · cited 12 times
Treatment of LESIMS Depth Profiles: a Procedure for Eliminating the Roughness Effect
2006
Characterization of sub-micrometre silicon films (Si-LPCVD) heavilyin situboron-doped and submitted to treatments of dry oxidation
2002 · Semiconductor Science and Technology · cited 2 times
TRAITEMENT NUMERIQUE DES MESURES PAR SONDE IONIQUE. APPLICATION AUX SILICIURES
2001 · Revue Sciences Humaines (Université des Frères Mentouri Constantine 1)

Publication venues

Applied Surface Science × 1
Semiconductor Science and Technology × 1
Revue Sciences Humaines (Université des Frères Mentouri Constantine 1) × 1

Publications per year

20081
20061
20021
20011

Collaborations

Partner institutions : University Ferhat Abbas of Setif · Université Constantine 2

Co-authors

Bibliographic data from OpenAlex (open database).