C. Kim

Affiliation : SK Group (United States)

1Publications (affiliation in the United States)
4Total publications
33Citations
3h-index

Research profile

C. Kim has 1 indexed publication (2020). Their work appears in “IEEE Transactions on Device and Materials Reliability”. Their most cited article, “Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability” (2020), has been cited 10 times. Their work is co-authored with at least 2 researchers.

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Research areas

Advancements in Semiconductor Devices and Circuit Design
Semiconductor materials and devices
Copper Interconnects and Reliability
Advanced Memory and Neural Computing
Ferroelectric and Negative Capacitance Devices

Publications (1)

Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability
2020 · IEEE Transactions on Device and Materials Reliability · cited 10 times

Collaborations

Partner institutions : Micron (United States)

Co-authors

Bibliographic data from OpenAlex (open database).