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F. Pascal
Affiliation : Centre National de la Recherche Scientifique · Université de Montpellier · Institut d'Électronique et des Systèmes
- 4Publications (affiliation in France)
- 140Total publications
- 1623Citations
- 15h-index
Research profile
F. Pascal has 4 indexed publications (2023–2026). Their work appears mainly in “Fluctuation and Noise Letters”, “Microelectronics Reliability” and “HAL”. Their most cited article, “Effects of X-ray and Cobalt 60 irradiations on advanced Si/SiGe:C HBTs DC characteristics” (2023), has been cited 2 times. 3 of these publications date from the last three years of activity. Their work is co-authored with at least 11 researchers, including institutions in Algeria.
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Create my free profile Add my publicationsResearch areas
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and interfaces
- Radio Frequency Integrated Circuit Design
- Advanced Semiconductor Detectors and Materials
Publications (4)
- X-Ray Impact on Generation-Recombination Low-Frequency Noise Components for Advanced Si/SiGe:C HBTs
- Study of electrical and X-ray induced degradation in 55-nm BiCMOS SiGe heterojunction bipolar transistors
- Study of Electrical and X-ray induced degradation in BiCMOS 55-nm SiGe:C Heterojunction Bipolar Transistors
- Effects of X-ray and Cobalt 60 irradiations on advanced Si/SiGe:C HBTs DC characteristics
Publication venues
- Fluctuation and Noise Letters × 1
- Microelectronics Reliability × 1
- HAL × 1
- European Conference on Radiation and Its Effects on Components and Systems × 1
Publications per year
- 20262
- 20251
- 20231
Collaborations
Partner institutions : STMicroelectronics (France) · Larbi Ben M'hidi University of Oum El Bouaghi
Co-authors’ countries : Algeria
Co-authors
- Daniel Gloria
- B. Sagnes
- A. Hoffmann
- J. Boch
- Pascal Chevalier
- Tadec Maraine
- A. Adebabay Belie
- M. Bouhouche
- S. Haendler
- Olivier Occello
- J. El Beyrouthy
Bibliographic data from OpenAlex (open database).
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